Angle-Resolved Spectrometer
Angle-Resolved Spectrometer
Availability: In Stock
Angle-Resolved Spectrometer
Optosky
Add to Wish List Compare this Product
Download Data Sheet
Product Code: GY8100
Ask About This Product
This product has a minimum quantity of 1000
application

The GY8100 integrates Optosky's spectral technology with a precision optical system, designed specifically for multi-angle spectral measurement needs. Through a high-precision electric rotating arm, the GY8100 can precisely control the optical path for 360° spatial rotation, paired with a high signal-to-noise ratio spectrometer, supporting absolute spectral efficiency detection.

The GY8100 can be used for rapid measurement of the reflection, transmission, and other spectra of various planar optical components. It adopts an intelligent automatic rotation design, adjusting the incident and outgoing directions separately, to achieve spectral measurements at different angles of the sample under test. The measurement modes include: upper reflection, lower reflection, transmission, scattering, radiation, free mode, and programming mode. It aims to provide users with a more multidimensional, broader wavelength range high-precision spectral analysis experience, meeting the application needs of fields such as micro-nano optics, photonic crystals, superconducting materials, and luminescent materials.

Categories: Industrial Measurement
Tags: GY
Excitation light
Light Source External 250nm-2500nmDeuterium-Tungsten Halogen Lamp, optional Deuterium Lamp
performance parameters
Spectral bandwidth 200nm-1000nm，expandable to2500nm
Electrical parameter
Interface USB Interface
Categories: Industrial Measurement
Tags: GY

    • Full-angle acquisition uses intelligent rotation design and supports 0-360° measurement.
    • Multiple modes Support 7 spectral measurement modes.
    • Wide spectrum range Supports spectral range detection from 200-2500nm.
    • Supports expansion Can connect external light sources such as lasers.
    • Multi-dimensional control Samples support multi-mode and multi-dimensional adjustment.
    • Data analysis Proprietary software can realize automated spectral acquisition, data analysis and spectral display.
    • Secondary development Provides a development toolkit to encapsulate all functions, add in one place, call in multiple places.

    Categories: Industrial Measurement
    Tags: GY

      • Structural Colors: The fundamental attribute of structural colors is their colorful appearance at different angles, necessitating the system to have multi-angle spectral detection capabilities.
      • Photonic Crystals: Photonic crystals achieve precise control over light beam characteristics such as polarization, direction, and frequency through their tunable band structure. Therefore, the system must have the capability to accurately characterize the band structure to guide the optimization of preparation processes.
      • Optical Thin Films: Thin films exhibit different reflectance at various angles, so the system must be able to accurately measure the reflectance data of thin films at different angles for comprehensive performance evaluation and optimization.
      • Luminescent Materials: The light intensity distribution is a crucial indicator for luminescent materials. Thus, the system needs to have the ability to receive luminescent information from all directions.
      • Metamaterials
      • Nanomaterials
      • Surface Plasmons
      • Gratings
      • Liquid Crystal Materials
      • Superlattice Materials

      Categories: Industrial Measurement
      Tags: GY


      Categories: Industrial Measurement
      Tags: GY

      Write a review

      Note: HTML is not translated!
      Related Products

      Powered By Optosky
      Optosky © 2024