SM280 is a microscopic thin flim thickness measuring instrument developed by using the principle of thin film reflected light interference. It uses the light with the widest wavelength range of 200-1700nm to be vertically incident on the surface of the film. As long as the film has a certain degree of transmission, the SM280 can calculate the film thickness according to the reflected interference spectrum. The thickness of the maximum mapping range can reach 10nm ~ 100um. SM280 is equipped with a dedicated microscope system, which can support the test of tiny samples with a minimum size of 10um. The software has template matching and auto-focus functions, and supports the drawing of measurement point paths and presentation of measurement results in 2D/3D.
SM280 automatic microscopic film thickness measuring instrument adopts integrated design. The core components adopt high-resolution and high-sensitivity spectrometer, high-performance industrial CCD and high-precision 3-axis mobile platform. Combined with Optosky unique algorithm technology, it provides users with a new generation of leading automatic microfilm thickness mapper.
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PC Software