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AFM-Raman Microscope
Product Code: ATRA8300
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  • This Raman instrument integrates an atomic force microscope (AFM), an optical microscope and a laser Raman spectrometer. AFM and Raman spectroscopy can be used respectively to characterize and analyze the surface morphology, particle size, roughness and Raman spectral performance of nanomaterials, thereby providing more comprehensive information on the sample and providing sharp microscopic images. Such integration allows users to improve work efficiency and spend more time on data collection and analysis, truly realizing in-situ detection and analysis of samples. The visual and precise positioning of the Raman detection platform allows observers to detect Raman signals of different surface states on the sample, and can simultaneously display the microdomain shape of the detected location on the computer.
  • Microscope objective is specially designed for the Raman system, which makes the laser spot close to the diffraction limit. It overcomes the problem that the focal plane for collecting Raman signals in ordinary Raman systems is slightly higher or slightly lower than the actual optimal focal plane, thus improving the quality of Raman spectra.
  • ATRA8300 has no optical path switching moving parts. All optical components are solid-state assembled and work very stably. It perfectly solves the loss of optical path for camera imaging and realizes the separation of camera imaging and Raman signal collection, thereby obtaining the best signal strength.

Confocal Raman Microscope
Wavelength 200nm~1100 nm
SNR >6000:1
Dynamic Range 13000:1
Spectral Range 250~2700 @ 3-8 cm-1 200~3500 @ 5-10 cm-1 200~4300 @ 6-12 cm-1 Other wavelength ranges can be customized, down to 50 cm-1
Detector Semiconductor cooling 2048*64 pixel back-illuminated infrared enhanced CCD
Pixel 14 μm * 14 μm
Spectral Stability σ/μ < 0.5% (COT 8 hours)
Temperature Stability Spectral shift ≤ 1 cm -1 (10~40 ℃)
Spot Diameter >1μm
Interface USB 2.0
Microscopic Illumination LED Kohler illumination
Objective Lens 5X/10X/20X/50X plan apochromatic objective lens
Microscope Camera 5 megapixel CMOS sensor
Focus Method BS: Coarse and fine manual focusing AF, MP: auto focus
Laser Stability σ/μ <±0.2%
Laser Linewidth 0.08 nm
Laser Power >550mW (software adjustable)
Laser Wavelength 785nm (±0.5nm)
Operating Mode Contact mode, tap mode
Optional Mode Friction/lateral force, amplitude/phase, magnetic/electrostatic force
Sample Size Φ≤68mm,H≤20mm
Scan Resolution Horizontal 0.2nm, vertical 0.05nm
Scan Rate 0.6Hz~30Hz
Scan Angle 0~360°

    • Combining the features of optics and AFM into a scientific research grade optical microscope.
    • Automated AFM registration system adjustment.
    • The laser detection head and sample scanning stage are integrated into one body, with stability and strong anti-interference ability.
    • Ease-of-use. Fully automated operation. Measuring only takes a few minutes.
    • High optical efficiency. Fast and sensitive analysis.
    • Intelligent needle insertion method with motor-controlled pressurized electric ceramic automatic detection to protect the probe and sample.
    • Ultra-high-power optical positioning system to achieve precise positioning of the probe and sample scanning area.
    • Integrated scanner nonlinearity correction user editor for nanometer characterization and measurement accuracy better than 98%.
    • A truly confocal capability with ultra-high spatial resolution. Generate high quality Raman images.
    • Raman microscopes come equipped with binoculoars.
    • Exceptional accuracy over the entire scan range.
    • Powerful software. Acquire, analyse and display high quality Raman data.

    • Nanoparticles
    • Life sciences, materials science, food science
    • Biology, biotechnology, biomedical, biochemistry
    • Forensic Medicine Identification
    • Pharmaceuticals and cosmetics
    • Archeology and arts
    • Photovoltaics and semiconductors

    Q: What is the ATRA8300 Raman instrument?
    A: The ATRA8300 is an advanced Raman instrument that integrates an Atomic Force Microscope (AFM), an optical microscope, and a laser Raman spectrometer. This combination allows for comprehensive analysis of nanomaterials by characterizing surface morphology, particle size, roughness, and Raman spectral properties, all while providing high-resolution microscopic images.


    Q: What are the main benefits of integrating AFM with optical microscopy and Raman spectroscopy?
    A: The integration of these technologies allows users to perform in-situ detection and analysis of samples, significantly improving work efficiency by enabling simultaneous data collection and analysis. This provides more comprehensive information on the sample and ensures high-quality Raman imaging.


    Q: How does the ATRA8300 ensure high-quality Raman spectra?
    A: The ATRA8300 features a specially designed microscope objective that positions the laser spot close to the diffraction limit. This design corrects the common issue of misalignment in focal planes, thereby improving the accuracy and quality of the Raman spectra.


    Q: What makes the ATRA8300’s optical system unique?
    A: The ATRA8300 has no optical path switching moving parts; all optical components are solid-state assembled, ensuring stable operation and preventing optical path loss. This design also allows for the separation of camera imaging and Raman signal collection, resulting in optimal signal strength and image quality.


    Q: What applications is the ATRA8300 suitable for?
    A: The ATRA8300 is versatile and suitable for a wide range of applications, including:
    Nanoparticle analysis
    Life sciences, materials science, and food science
    Biology, biotechnology, biomedical research, and biochemistry
    Forensic medicine identification
    Pharmaceuticals and cosmetics
    Archaeology and arts
    Photovoltaics and semiconductors


    Q: How does the ATRA8300 ensure precise probe and sample positioning?
    A: The ATRA8300 is equipped with an ultra-high-power optical positioning system that achieves precise positioning of the probe and sample scanning area. It also features an intelligent needle insertion method with motor-controlled pressurized electric ceramic detection to protect both the probe and the sample.


    Q: What are the key features that enhance the ease of use of the ATRA8300?
    A: The ATRA8300 is designed for ease of use, with fully automated operation and an automated AFM registration system adjustment. Measurements can be completed in just a few minutes, making it efficient and user-friendly.


    Q: How does the ATRA8300 handle nonlinearities in scanning?
    A: The ATRA8300 includes an integrated scanner nonlinearity correction editor, ensuring nanometer characterization with measurement accuracy better than 98%. This guarantees exceptional accuracy across the entire scan range.


    Q: Does the ATRA8300 offer confocal capabilities?
    A: Yes, the ATRA8300 offers true confocal capabilities with ultra-high spatial resolution, allowing for the generation of high-quality Raman images. This feature is crucial for detailed and precise sample analysis.


    Q: What software features are available with the ATRA8300?
    A: The ATRA8300 comes with powerful software designed to acquire, analyze, and display high-quality Raman data. The software is intuitive and enhances the overall efficiency of the analysis process.

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