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atomic force microscopy
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atomic force microscopy
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Product Code: ATRA8300
application
This Raman instrument integrates an atomic force microscope (AFM), an optical microscope and a laser Raman spectrometer. AFM and Raman spectroscopy can be used respectively to characterize and analyze the surface morphology, particle size, roughness and Raman spectral performance of nanomaterials, thereby providing more comprehensive information on the sample and providing sharp microscopic images. Such integration allows users to improve work efficiency and spend more time on data collection and analysis, truly realizing in-situ detection and analysis of samples. The visual and precise positioning of the Raman detection platform allows observers to detect Raman signals of different surface states on the sample, and can simultaneously display the microdomain shape of the detected location on the computer.
Microscope objective is specially designed for the Raman system, which makes the laser spot close to the diffraction limit. It overcomes the problem that the focal plane for collecting Raman signals in ordinary Raman systems is slightly higher or slightly lower than the actual optimal focal plane, thus improving the quality of Raman spectra.
ATRA8300 has no optical path switching moving parts. All optical components are solid-state assembled and work very stably. It perfectly solves the loss of optical path for camera imaging and realizes the separation of camera imaging and Raman signal collection, thereby obtaining the best signal strength.
Model | Functional features |
ATRA8300BS | Raman microscope +AFM all-in-one machine, basic type |
ATRA8300AF | Auto focus |
ATRA8300MP | Mapping type (highest configuration, auto focus, auto scan type) |
| Detector | |
| Detector type | Semiconductor cooling 2048*64 pixel back-illuminated infrared enhanced CCD |
| Optical parameter | |
| SNR | >6000:1 |
| raman spectrometer | |
| Spectral Range and Spectral Resolution | 250~2700 @ 3-8 cm-1 200~3500 @ 5-10 cm-1 200~4300 @ 6-12 cm-1 Other wavelength ranges can be customized, down to 50 cm-1 |
| Spectral Stability | σ/μ < 0.5% (COT 8 hours) |
| Detection Wavelength Range | 200nm~1100 nm |
| Pixel Size | 14 μm * 14 μm |
| Detector Dynamic Range | 13000:1 |
| Laser Center Wavelength | 785nm (±0.5nm) |
| Microscope Camera System | 3 or 5 megapixel industrial cameras |
| Focus Method | Conjugate focus |
| Raman Spectrometer System Parameters | |
| Laser stability | σ/μ <±0.2% |
| Export Report | USB2.0 |
| Raman spectrometer Relibility | |
| Temperature Stability | Spectral shift ≤ 1 cm-1 (10-40 ℃) |
| Raman Spectrometer Laser Parameters | |
| Laser power | >550mW (software adjustable) |
| Laser Linewidth | 0.08 nm |
| Laser Spot Diameter | >1μm |
| X,Y-axis electronic controlled platform | |
| Moving Range | 50×50 mm，100×100 mm optional |
| Moving Resolution | 0.1μm |
| Positioning Accuracy | 1μm |
| Z-axis（Auto-Focus） | |
| Focus Accuracy | ≤ ±0.2μm |
| Focus Speed | Less than 10 s |
| Microscope Module | |
| Operating mode | Contact mode, tap mode |
| Optional mode | Friction/lateral force, amplitude/phase, magnetic/electrostatic force |
| Force spectrum curve | F-Z force curve, RMS-Z curve |
| Objectives | 5X/10X/20X/50X plan apochromatic objective lens |
| XY scan range | 50×50um，20×20um and 100×100um optional |
| Z scan range | 5um，2.5um and 10um optional |
| Scan resolution | Horizontal 0.2nm, vertical 0.05nm |
| Sample size | Φ≤68mm，H≤20mm |
| Optical eyepieces | 10X |
| Optical focus | BS: Coarse and fine manual focusing AF, MP: auto focus |
| Monitor | 10.1-inch flat panel display with image measurement function |
| Illumination System | LED Kohler illumination |
| Camera | 5 megapixel CMOS sensor |
| Scan rate | 0.6Hz~30Hz |
| Scan angle | 0~360° |
lCombining the features of optics and AFM into a scientific research grade optical microscope.
lAutomated AFM registration system adjustment.
lThe laser detection head and sample scanning stage are integrated into one body, with stability and strong anti-interference ability.
lEase-of-use. Fully automated operation. Measuring only takes a few minutes.
lHigh optical efficiency. Fast and sensitive analysis.
lIntelligent needle insertion method with motor-controlled pressurized electric ceramic automatic detection to protect the probe and sample.
lUltra-high-power optical positioning system to achieve precise positioning of the probe and sample scanning area.
lIntegrated scanner nonlinearity correction user editor for nanometer characterization and measurement accuracy better than 98%.
lA truly confocal capability with ultra-high spatial resolution. Generate high quality Raman images.
lRaman microscopes come equipped with binoculoars.
lExceptional accuracy over the entire scan range.
lPowerful software. Acquire, analyse and display high quality Raman data.
lNanoparticles
lLife sciences, materials science, food science
lBiology, biotechnology, biomedical, biochemistry
lForensic Medicine Identification
lPharmaceuticals and cosmetics
lArcheology and arts
lPhotovoltaics and semiconductors
