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Desktop Octave Integrating Reflectometer
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Desktop Octave Integrating Reflectometer
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Product Code: SM120TB
application
In the field of solar cell manufacturing, obtaining the reflectivity of solar silicon wafers is extremely important for production control and research, but due to the special surface of the velvet, it is very difficult to measure its reflectivity.
Optosky has launched a new desktop octave-angle integral reflectometer SM120TB based on ISO7724 and DIN5033 standards and combined with years of experience in spectral instrument development. It is the best solution to this problem. SM120TB is used in the monitoring of the cell velvet process, providing customers with an effective detection solution for cell quality control and loss reduction.
In the field of solar cell manufacturing, obtaining the reflectivity of solar silicon wafers is extremely important for production control and research, but due to the special surface of the velvet, it is very difficult to measure its reflectivity.
Optosky has launched a new desktop octave-angle integral reflectometer SM120TB based on ISO7724 and DIN5033 standards and combined with years of experience in spectral instrument development. It is the best solution to this problem. SM120TB is used in the monitoring of the cell velvet process, providing customers with an effective detection solution for cell quality control and loss reduction.
| Detector | |
| Dynamic range | 65535 : 1 |
| Measurement Range | 1mm~10mm |
| Repeatability | Better than 1% |
| Engineering | |
| Wavelength range | 360nm-1050nm |
| Excitation light | |
| Light Source | Halogen lamp, 100W |
| Instrument | |
| Power Supply | AC 220 ~ 240V, 50/60Hz |
| Optical parameter | |
| Accuracy | Better than 0.2% |
| Working temperature | 0 ~ 50℃ |
| Light Source | |
| Lifespan | More than 3000hours |
