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Automatic Octave Integrating Reflectometer
Availability: In Stock
Automatic Octave Integrating Reflectometer
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Product Code: SM120
application
In the field of solar cell manufacturing, obtaining the reflectivity of solar silicon wafers is extremely important for production control and research, but due to the special surface of the velvet, it is very difficult to measure its reflectivity.
Optosky's new fully automatic octave-angle integral reflectometer SM120, based on ISO7724 and DIN5033 standards and combined with years of experience in spectral instrument development, is the best solution to this problem. SM120 is used in the monitoring of the cell velvet process, providing customers with an effective detection solution for cell quality control and loss reduction.
| Detector | |
| Dynamic range | 65535 : 1 |
| Measurement Range | 1mm~10mm |
| Repeatability | Better than 1% |
| Engineering | |
| Wavelength range | 360nm-1050nm |
| Excitation light | |
| Light Source | Halogen lamp, 100W |
| Instrument | |
| Power Supply | AC 220 ~ 240V, 50/60Hz |
| Optical parameter | |
| Accuracy | Better than 0.2% |
| Working temperature | 0 ~ 50℃ |
| parameter | |
| Aperture size | 10 mm |
| Light Source | |
| Lifespan | More than 3000hours |
