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XRF spectrometer
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Product Code: ATX3450
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XRF spectrometer analysis has the advantages of simple sample preparation, fast analysis speed, wide analysis content range, good reproducibility and high accuracy. With the continuous promotion of X-ray fluorescence spectrometer analysis technology, the use of X-ray fluorescence spectrometer analysis and detection has become the main means of quality control in many industries.

The RoHS detector ATX3450 uses the American Amptek detector Si-pin, electric cooling instead of liquid nitrogen cooling, small size, accurate data analysis and low maintenance cost.
The self-developed SES signal processing system is adopted to effectively improve the sensitivity of the measurement and make the measurement more accurate.

Seven optical path correction and collimation systems, automatic switching according to different samples, one-button automatic testing, simpler, more convenient and more user-friendly.

Multiple instrument accessories protection system, and full monitoring through software, make the instrument work more stable and safer.

Tags: ATX
XRF Spectrometer Series
Accuracy RSD≤0.05% Ag≥90%
Elemental analysis From sulfur (S) to uranium (U)
Content analysis 1 PPm to 100%
Sample Chamber Dimensions 439*300*150mm
LOD 1ppm
Sample Status Solid, powder, liquid
Light Tube Flow 5μA~1000μA
Repeatability Of Multiple Measurements 0.1%
Stability Of Multiple Measurements 0.1%
Tags: ATX

  • Unique movement temperature control technology
  • Multiple instrument accessories protection system
  • Advanced integrated heat dissipation design
  • Non-destructive, fast and accurate sample analysis
  • High precision, high resolution and high reliability
  • Humanized interface, convenient operation and high-definition camera

Tags: ATX

  • RoHS
  • Material Science :Shoe Leather
  • Industrial Science:Automobile ELV
  • Archeology:Archaeological analysis
  • Public Safety:Refractory materials
  • Minerals:Ore analysis
  • Material Testing :Metal alloys
  • Petrochemicals:Oil & Energy
  • Coating thickness measurement

Tags: ATX

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